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3D Shape Measurement with Binary Dithered Patterns
Category(s):
For Information, Contact:
Jay Bjerke
Commercialization Manager, Engineering
515-294-4740
licensing@iastate.edu
Web Published:
12/7/2015
ISURF #
4024
Summary:
Construction technique for construction of high quality 3-D images

Development Stage:
Description:
Iowa State University Researchers have developed a binary defocusing technique for three-dimensional (3D) shape measurement.   The technique produces H:igh quality sinusoidal patterns by using a technique currently used in digital signal processing.  This image processing method uses dithering (half-toning) to produce high-quality 3D images.  A projector creates the image and the fringe patterns are captured using an imaging device.   Fringe analysis and optimization is then used to reconstruct the 3D shape of the object.  The phase error is less than 0.6% even when the fringe stripes are wide and the projector is nearly focused.

Advantage:
• Simple to implement
• Enables pixel-level resolution
• Relatively high speed

Application:
3-D Imaging
Patent Information:
*To see the full version of the patent(s), follow the link below, then click on "Images" button.
Country Serial No. Patent No. Issued Date
United States 13/732,548 8,929,644* 1/6/2015


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